(513) 847-1510

Electrical Metrology Labs

Precision Environments Designs and Builds Electrical Metrology Labs Specifically Measuring the Four Fundamental Units of Electricity

Electrical Metrology Laboratories

Electrical Metrology Laboratory

Electrical Metrology Laboratory

Precision Environments designs and builds laboratories specifically for electrical metrology.  Over the past 30 years, electrical metrology laboratories have used the quantum behavior of the Josephson effect to greatly improve voltage metrology.[1] Electrical standards, such as the Josephson Junction, occupy many the electrical metrology laboratories Precision Environments has designed and built.

A unique feature of the electrical metrology laboratory is the shielding requirement. Shielded enclosures have traditionally been constructed of unfinished steel or Mu metal to shield sensitive electronic equipment against static or low-frequency magnetic fields. However, due to its reflective nature, this material is not conducive for a productive human work environment. Precision Environments has developed a shielded enclosure that is bright but also provides a positive work environment that promotes employee satisfaction and productivity.

Electrical Lab Design Features

Precision Environment’s electrical metrology laboratories can be designed for any size requirement with standard features such as shielded doors, power line filters, control line filters, data line filters, and wave guides. Typical design considerations include:

  • Temperature Stability
  • Temperature Gradients
  • Cleanroom Cleanliness
  • ESD Control
  • EMI/RFI Attenuation
  • Static Electricity
  • Grounding

Electrical Lab Solutions

From concept through design and construction Precision Environments works interactively with each individual customer to develop an electrical metrology laboratory solution appropriate for the operational expectations and budget.

[1] Jeanneret, B., Benz, S. Application of the Josephson effect in electrical metrology. Eur. Phys. J. Spec. Top. 172, 181–206 (2009). https://doi.org/10.1140/epjst/e2009-01050-6

Let's discuss your next project